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单词 Atomic force microscope
释义

Atomic force microscope

原声例句
科学60秒-科学美国人 2021年10月合集

One scientist even used the atomic force microscope to “listen” to proteins unfold.

有位科学家甚至用原子力显微镜“听”蛋白质打开的声音。

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Thank you, atomic force microscopes, for an awesome 2015.

感谢原子力显微镜, 感谢您在 2015 年的精彩表现。

科学60秒-科学美国人 2021年10月合集

This tiny arm with a shard from a smashed needle was the first version of what would become known as the atomic force microscope, or AFM.

这个有唱针碎段的小悬臂就是后来著名的“原子力显微镜(AFM)”的最初版本。

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Luckily, engineers at MIT developed a new atomic force microscope that’s the fastest microscope of its kind in the world.

幸运的是, 麻省理工学院的工程师开发了一种新型原子力显微镜,它是世界上同类显微镜中速度最快的。

科学杂志:动物学

The new insights came from using an atomic force microscope to look closely at the silk of the venomous brown recluse spider.

新的见解来自使用原子力显微镜仔细观察有毒的棕色隐士蜘蛛的丝。

科学60秒-科学美国人 2021年10月合集

The atomic force microscope made it possible for scientists to watch ion channels open and close, test out devices that are too small to see—the list goes on and on.

原子力显微镜创造了可能,让科学家们得以观察离子通道打开和关闭,以及检验体积小到无法看到的设备——它对科技的启发推动仍在继续。

科学60秒-科学美国人 2021年10月合集

In 1986 Dr. Binnig shared the Nobel Prize in Physics for the design of the scanning tunneling microscope and later, in 2016, he shared the Kavli Prize in Nanoscience for the invention of the atomic force microscope.

1986年,Binnig 博士因设计出扫描隧道显微镜而与他人共同获得诺贝尔物理学奖,之后的2016年,他又凭借发明原子力显微镜而与其他研究者共同获得了卡夫里纳米科学奖。

英语百科

Atomic-force microscopy

 An atomic-force microscope on the left with controlling computer on the right.
 Block diagram of atomic-force microscope using beam deflection detection. As the cantilever is displaced via its interaction with the surface, so too will the reflection of the laser beam be displaced on the surface of the photodiode.
Fig. 3: Typical configuration of an AFM.
(1):: Cantilever, 
(2): Support for cantilever, 
(3): Piezoelectric element(to oscillate cantilever at its eigen frequency.), 
(4): Tip (Fixed to open end of a cantilever, acts as the probe), 
(5): Detector of deflection and motion of the cantilever, 
(6): Sample to be measured by AFM, 
(7): xyz drive, (moves sample (6) and stage (8) in x, y, and z directions with respect to a tip apex (4)), and
(8): Stage.
Fig. 5: Topographic image forming by AFM.
(1): Tip apex,
(2): Sample surface,
(3): Z-orbit of Tip apex,
(4): Cantilever.

Atomic-force microscopy (AFM) or scanning-force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

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更新时间:2025/6/20 12:18:52