| 释义 |
semiconductor device reliability testing
- 半导体器件bàn dǎo tǐ qì jiàn
semiconductor device; semiconductor apparatus
- 可靠性测试kě kào xìng cè shì
reliability testing
- 可信度kě xìn dù
reliability
- 冗余测试rǒng yú cè shì
redundancy testing
- 窄禁带半导体zhǎi jìn dài bàn dǎo tǐ
narrow bandgap semiconductor
- 涡流检测wō liú jiǎn cè
eddy current testing
- 读写能力测验dú xiě néng lì cè yàn
alpha testing
- 斗链式掐dòu liàn shì qiā
bucket brigade device; BBD
- 可靠性kě kào xìng
reliability; dependability (inservice); responsibility; probability of reliability
- 半导体bàn dǎo tǐ
semiconductor
- 块设备kuài shè bèi
block device
- 矢量仪shǐ liàng yí
vectorscope device
- 串行设备chuàn háng shè bèi
serial device
- 复合设备fù hé shè bèi
compound device
- 音频设备yīn pín shè bèi
audio device
- 遥控设备yáo kòng shè bèi
remote device, robot
- 试验的shì yàn de
testing
- 可信赖性kě xìn lài xìng
reliability
- 锗半导体zhě bàn dǎo tǐ
germanium semiconductor
- 可靠性好kě kào xìng hǎo
good reliability
- 半导体物理bàn dǎo tǐ wù lǐ
semiconductor physics
- 掺杂半导体chān zá bàn dǎo tǐ
doped semiconductor
- 瞄准装置miáo zhǔn zhuāng zhì
collimation equipment; aiming device; sighting device
- 测试cè shì
test; testing; checkout; measurement
- 检测工具jiǎn cè gōng jù
testing tool
|