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单词 SBIS
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SBIS

英语百科

Stanford–Binet Intelligence Scales

Reproduction of an item from the 1908 Binet-Simon intelligence scale, showing three pairs of pictures, about which the tested child was asked,
Maud Merrill

The Stanford–Binet Intelligence Scales (or more commonly the Stanford-Binet) is an individually administered intelligence test that was revised from the original Binet-Simon Scale by Lewis M. Terman, a psychologist at Stanford University. The Stanford–Binet Intelligence Scale is now in its fifth edition (SB5) and was released in 2003. It is a cognitive ability and intelligence test that is used to diagnose developmental or intellectual deficiencies in young children. The test measures five weighted factors and consists of both verbal and nonverbal subtests. The five factors being tested are knowledge, quantitative reasoning, visual-spatial processing, working memory, and fluid reasoning.

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更新时间:2025/6/17 0:23:45