| 释义 |
wafer inspection microscope
- 低倍显微镜dī bèi xiǎn wēi jìng
low power microscope; low-magnification microscope
- 扫描电镜sǎo miáo diàn jìng
scanning electron microscope
- 海关检查hǎi guān jiǎn chá
customs inspection
- 射线探伤shè xiàn tàn shāng
radiographic inspection
- 外观检查wài guān jiǎn chá
appearance inspection
- 圣饼shèng bǐng
wafer
- 圆片yuán piàn
wafer
- 显微镜xiǎn wēi jìng
microscope
- 干胶片gàn jiāo piàn
wafer
- 裂隙灯角膜显微镜liè xì dēng jiǎo mó xiǎn wēi jìng
slit lamp corneal microscope
- 视察shì chá
inspection
- 终检zhōng jiǎn
final inspection
- 到货验收dào huò yàn shōu
inspection of incoming merchandise; inspection of merchandise received
- 晶片jīng piàn
chip; crystal plate; wafer
- 芯片xīn piàn
slug; chip; die; wafer
- 出巡chū xún
tour of inspection
- 检疫jiǎn yì
quarantine; quarantine inspection
- 电子显微镜diàn zǐ xiǎn wēi jìng
electron microscope
- 极薄jí báo
as thin as a wafer
- 立体显微镜lì tǐ xiǎn wēi jìng
stereomicroscope, stereoscopic microscope
- 加重检验jiā zhòng jiǎn yàn
increased inspection
- 治具zhì jù
jig; exclusive inspection gauge
- 舟艇检查zhōu tǐng jiǎn chá
boat inspection
- 尺寸检查chǐ cùn jiǎn chá
dimension check; dimensional inspection
- 焊接检验hàn jiē jiǎn yàn
welding testing; welding inspection
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