| 释义 |
semiconductor device measurements
- 半导体器件bàn dǎo tǐ qì jiàn
semiconductor device; semiconductor apparatus
- 窄禁带半导体zhǎi jìn dài bàn dǎo tǐ
narrow bandgap semiconductor
- 磁性测量cí xìng cè liàng
magnetic measurement
- 光学测量guāng xué cè liàng
optical measurement
- 介质测量jiè zhì cè liàng
Medium Measurement
- 态度测量tài dù cè liàng
attitude measurement
- 话务量测量huà wù liàng cè liàng
traffic measurement
- 计量标准jì liàng biāo zhǔn
measurement criteria; measurement standard
- 间接测量jiān jiē cè liàng
indirect measurement; indirect observation
- 斗链式掐dòu liàn shì qiā
bucket brigade device; BBD
- 半导体bàn dǎo tǐ
semiconductor
- 块设备kuài shè bèi
block device
- 矢量仪shǐ liàng yí
vectorscope device
- 衡量尺度héng liàng chǐ dù
levels of measurement; measurement scale
- 串行设备chuàn háng shè bèi
serial device
- 复合设备fù hé shè bèi
compound device
- 音频设备yīn pín shè bèi
audio device
- 遥控设备yáo kòng shè bèi
remote device, robot
- 测量法cè liàng fǎ
measurement
- 锗半导体zhě bàn dǎo tǐ
germanium semiconductor
- 半导体物理bàn dǎo tǐ wù lǐ
semiconductor physics
- 掺杂半导体chān zá bàn dǎo tǐ
doped semiconductor
- 瞄准装置miáo zhǔn zhuāng zhì
collimation equipment; aiming device; sighting device
- 族半导体zú bàn dǎo tǐ
group iii v semiconductor
- 测试cè shì
test; testing; checkout; measurement
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