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单词 Selected area diffraction
释义

Selected area diffraction

英语百科

Selected area diffraction

SADP of a single austenite crystal in a piece of steel

Selected area (electron) diffraction (abbreviated as SAD or SAED), is a crystallographic experimental technique that can be performed inside a transmission electron microscope (TEM).

In a TEM, a thin crystalline specimen is subjected to a parallel beam of high-energy electrons. As TEM specimens are typically ~100 nm thick, and the electrons typically have an energy of 100–400 kiloelectron volts, the electrons pass through the sample easily. In this case, electrons are treated as wave-like, rather than particle-like (see wave-particle duality). Because the wavelength of high-energy electrons is a few thousandths of a nanometer, and the spacing between atoms in a solid is about a hundred times larger, the atoms act as a diffraction grating to the electrons, which are diffracted. That is, some fraction of them will be scattered to particular angles, determined by the crystal structure of the sample, while others continue to pass through the sample without deflection.

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更新时间:2025/6/19 23:57:06