扫描探针显微镜
扫描探针显微镜（Scanning probe microscopy，SPM）是所有机械式地用探针在样本上扫描移动以探测样本影像的显微镜的统称。其影像分辨率主要取决于探针的大小〔通常在奈米的范围〕。扫描隧道显微镜是第一个被发明的扫描探针显微镜〔1981年〕。
| 单词 | Scanning probe microscopy |
| 释义 |
Scanning probe microscopy
中文百科
扫描探针显微镜扫描探针显微镜（Scanning probe microscopy，SPM）是所有机械式地用探针在样本上扫描移动以探测样本影像的显微镜的统称。其影像分辨率主要取决于探针的大小〔通常在奈米的范围〕。扫描隧道显微镜是第一个被发明的扫描探针显微镜〔1981年〕。
英语百科
Scanning probe microscopy 扫描探针显微镜Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Binnig and Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe. |
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