自动测试图样产生（英语：Automatic test pattern generation, ATPG）系统是一种工具，产生数据给制造出来后的数字电路作测试使用。

超大型集成电路的测试平台，要达到非常高的错误涵盖率（en:Fault coverage）是非常困难的工作，因为它的复杂度很高。 针对组合逻辑电路（Combinatorial logic）和时序逻辑电路（Sequential logic）的电路测试，必须要使用不同的 ATPG 方法。

ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The generated patterns are used to test semiconductor devices after manufacture, and in some cases to assist with determining the cause of failure (failure analysis.) The effectiveness of ATPG is measured by the amount of modeled defects, or fault models, that are detected and the number of generated patterns. These metrics generally indicate test quality (higher with more fault detections) and test application time (higher with more patterns). ATPG efficiency is another important consideration. It is influenced by the fault model under consideration, the type of circuit under test (full scan, synchronous sequential, or asynchronous sequential), the level of abstraction used to represent the circuit under test (gate, register-transfer, switch), and the required test quality.