| 释义 |
Measurement Microscope
- 介质测量jiè zhì cè liàng
Medium Measurement
- 低倍显微镜dī bèi xiǎn wēi jìng
low power microscope; low-magnification microscope
- 扫描电镜sǎo miáo diàn jìng
scanning electron microscope
- 磁性测量cí xìng cè liàng
magnetic measurement
- 光学测量guāng xué cè liàng
optical measurement
- 态度测量tài dù cè liàng
attitude measurement
- 话务量测量huà wù liàng cè liàng
traffic measurement
- 显微镜xiǎn wēi jìng
microscope
- 计量标准jì liàng biāo zhǔn
measurement criteria; measurement standard
- 间接测量jiān jiē cè liàng
indirect measurement; indirect observation
- 裂隙灯角膜显微镜liè xì dēng jiǎo mó xiǎn wēi jìng
slit lamp corneal microscope
- 衡量尺度héng liàng chǐ dù
levels of measurement; measurement scale
- 测量法cè liàng fǎ
measurement
- 电子显微镜diàn zǐ xiǎn wēi jìng
electron microscope
- 立体显微镜lì tǐ xiǎn wēi jìng
stereomicroscope, stereoscopic microscope
- 测试cè shì
test; testing; checkout; measurement
- 度量dù liàng
measurement; tolerance; measure; magnanimity
- 度量单位制dù liàng dān wèi zhì
measurement
- 腰身yāo shēn
girth, waist, waist measurement
- 姿态测量zī tài cè liàng
attitude measurement
- 尺寸chǐ cùn
measurement; dimensions; size; magnitude; admeasurement
- 尺码表chǐ mǎ biǎo
size specification; measurement chart
- 衡量héng liàng
weigh; measure; judge; measurement; scalage
- 半导体测量bàn dǎo tǐ cè liàng
Measurement of Semiconductors
- 磁测量技术cí cè liàng jì shù
Magnetic Measurement Technology
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